DocumentCode
1985494
Title
Digest of Papers. Eleventh Annual 1993 IEEE VLSI Test Symposium (Cat. No.93TH0537-1)
fYear
1993
fDate
6-8 April 1993
Abstract
Presents the cover from the proceedings of this conference.
Keywords
VLSI; automatic testing; built-in self test; failure analysis; integrated circuit testing; logic testing; ATPG; BIST; aliasing; compaction; debugging; electric current testing; error detection; failure analysis; mixed signal testing; pseudorandom testing; regular structures; simulation; test methodologies; testability;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location
Atlantic City, NJ, USA
Print_ISBN
0-8186-3830-3
Type
conf
DOI
10.1109/VTEST.1993.313317
Filename
313317
Link To Document