DocumentCode
1988190
Title
Performance analysis and comparison of two 1T/1MTJ-based logic gates
Author
Mahmoudi, Hiwa ; Windbacher, Thomas ; Sverdlov, Viktor ; Selberherr, Siegfried
Author_Institution
Inst. for Microelectron., Tech. Univ. Wien, Vienna, Austria
fYear
2013
fDate
3-5 Sept. 2013
Firstpage
163
Lastpage
166
Abstract
A performance analysis and comparison of two one-transistor/one-magnetic tunnel junction (1T/1MTJ)-based logic gates is presented. The energy consumption as well as the reliability of different Boolean logic functions utilizing the two circuit topologies are studied and the adequacy of their employment for specific non-volatile logic applications is discussed. It has been shown that the implication logic design exhibits a more reliable behavior compared to the reprogrammable logic design featuring conventional Boolean logic operations like (N)AND and (N)OR. Although the comparison between the two error optimized logic gate types shows that the fundamental logic operations with the reprogrammable gates require less energy than with the IMP gates, the situation reverses for more complex Boolean logic operations.
Keywords
Boolean functions; energy consumption; logic design; logic gates; magnetic tunnelling; 1T/1MTJ-based logic gates; Boolean logic functions; NAND logic; NOR logic; circuit topologies; energy consumption; logic design; one-transistor/one-magnetic tunnel junction; performance analysis; reliability; reprogrammable gates; Error probability; Logic functions; Logic gates; Magnetic tunneling; Resistance; Switches; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices (SISPAD), 2013 International Conference on
Conference_Location
Glasgow
ISSN
1946-1569
Print_ISBN
978-1-4673-5733-3
Type
conf
DOI
10.1109/SISPAD.2013.6650600
Filename
6650600
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