• DocumentCode
    1988194
  • Title

    Prediction of radiation resistance of CMOS integrated microcircuits

  • Author

    Korshunov, F.P. ; Bogatyrev, Yu.V. ; Belous, A.I. ; Shwedov, G.V. ; Lastovsky, S.B. ; Karas, V.I. ; Kulgachev, V.I.

  • Author_Institution
    Sci.-Practical Mater. Res. Centre, NAS of Belarus, Minsk, Belarus
  • fYear
    2009
  • fDate
    14-18 Sept. 2009
  • Firstpage
    721
  • Lastpage
    723
  • Abstract
    The results of experimental researches and the calculating-experimental method of prediction of radiation resistance of logic CMOS integrated microcircuits at influence of fast electrons are submitted.
  • Keywords
    CMOS logic circuits; electron beam effects; fast electron effects; logic CMOS integrated microcircuits; radiation resistance; CMOS integrated circuits; Electrons; Helium; IEEE catalog; MOSFET circuits; Organizing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
  • Conference_Location
    Sevastopol
  • Print_ISBN
    978-1-4244-4796-1
  • Type

    conf

  • Filename
    5292900
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1988194