DocumentCode
1988300
Title
Error Analysis in Fast Near Field Probing by the Modulated Scattering Technique
Author
Bolomey, J. Ch ; Picard, D.
fYear
1983
fDate
3-8 Sept. 1983
Firstpage
835
Lastpage
838
Abstract
This paper is devoted to the discussion of available measurement accuracies of linear arrays operating according to the modulated scattering technique. The combination of a fast electronic scanning on a line with a rotation of the antenna under test provides a substantial reduction of the near field probing duration as compared to fully mechanical scanning solutions. The effects of coupling, fabrication tolerances and components dispersion have been numerically simulated.
Keywords
Antenna measurements; Diodes; Dipole antennas; Dispersion; Error analysis; Linear antenna arrays; Numerical simulation; Probes; Scattering; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1983. 13th European
Conference_Location
Nurnberg, Germany
Type
conf
DOI
10.1109/EUMA.1983.333202
Filename
4131994
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