• DocumentCode
    1989768
  • Title

    Formal verification of memory arrays using symbolic trajectory evaluation

  • Author

    Pandey, Manish ; Bryant, Randal E.

  • Author_Institution
    Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    1997
  • fDate
    11-12 Aug 1997
  • Firstpage
    42
  • Lastpage
    49
  • Abstract
    Verification of memory arrays is an important part of processor verification. Memory arrays include circuits such as on-chip caches, cache tags, register files, and branch prediction buffers having memory cores embedded within complex logic. These circuits are typically custom designed at the transistor-level to optimize area and performance. This makes it necessary to verify them at the transistor-level. Conventional array verification approaches are based on switch-level simulation. Such approaches do not work for arrays as it is infeasible to simulate the astronomical number of simulation patterns that are required to verify these designs. Therefore, formal methods are required to ensure the correctness of memory arrays. This paper describes the formal verification technique of Symbolic Trajectory Evaluation (STE), and its application to verify memory arrays. The paper describes techniques to overcome the limitations of STE in verifying large complex memory arrays. It shows how exploiting symmetry allows one to verify systems several orders of magnitude larger than otherwise possible. The results of verifying SRAM arrays, including a 256 Kbit circuit having over 1.5 million transistors, are presented. The paper also shows how judicious Boolean encodings can be used with STE to efficiently verify CAMs
  • Keywords
    SRAM chips; buffer storage; cellular arrays; content-addressable storage; integrated circuit testing; 256 Kbit; Boolean encodings; CAMs; SRAM arrays; branch prediction buffers; cache tags; formal verification; memory arrays; memory cores; on-chip caches; processor verification; register files; symbolic trajectory evaluation; transistor-level verification; Boolean functions; Cams; Circuit simulation; Costs; Design optimization; Encoding; Formal verification; Logic arrays; Phased arrays; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design and Testing, 1997. Proceedings., International Workshop on
  • Conference_Location
    San Jose, CA
  • ISSN
    1087-4852
  • Print_ISBN
    0-8186-8099-7
  • Type

    conf

  • DOI
    10.1109/MTDT.1997.619393
  • Filename
    619393