• DocumentCode
    1992807
  • Title

    Wavelength influence on CMOS SOS IC dose rate laser simulation efficiency

  • Author

    Skorobogatov, Petr K. ; Nikiforov, Alexander Y. ; Egorov, Andrey N. ; Ulanova, Anastasia V. ; Davydov, Georgii G.

  • Author_Institution
    NRNU MEPhI, Moscow, Russia
  • fYear
    2013
  • fDate
    23-27 Sept. 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Dose rate effects wavelength dependence under pulsed laser irradiation of typical CMOS thin-film structure is investigated. The optimal wavelength for maximum laser simulation efficiency is defined.
  • Keywords
    CMOS integrated circuits; laser beam effects; silicon-on-insulator; CMOS SOS IC dose rate; CMOS thin-film structure; laser simulation efficiency; pulsed laser irradiation; wavelength influence; Absorption; CMOS integrated circuits; Inverters; Lasers; Logic gates; Radiation effects; Semiconductor device modeling; SOS structure; dose rate effects; laser wavelength;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
  • Conference_Location
    Oxford
  • Type

    conf

  • DOI
    10.1109/RADECS.2013.6937412
  • Filename
    6937412
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1992807