DocumentCode
2002021
Title
Fabrication of SAW devices with small package size using through substrate via technology
Author
Koh, Keishin ; Okitsui, Hiroyuki ; Hohkawa, Kohji
Author_Institution
Fac. of Eng., Kanagawa Inst. of Technol., Atsugi, Japan
fYear
2009
fDate
20-23 Sept. 2009
Firstpage
2688
Lastpage
2691
Abstract
In order to realize SAW devices with smallest package size and investigate possibility of three dimension packaging of SAW devices, we propose the novel packaging method of SAW devices, in which two same SAW devices with half size of overlap length of the original device are bonded in face to face structure and two same SAW devices are electrically connected in parallel by through substrate via technology. We investigated processes conditions of the through substrate via electrode for piezoelectric substrate. We also investigated effect of some parameters such as through substrate via electrode material, bonding conditions. We fabricated test devices using Quartz substrate. Experimental results indicated that there is no change in the frequency characteristics between half size devices bonded and original devices.
Keywords
bonding processes; packaging; quartz; surface acoustic wave devices; three-dimensional integrated circuits; 3D packaging; SAW devices; TSV technology; device bonding; face to face structure; package size; piezoelectric substrate; quartz substrate; through substrate via electrode; through substrate via technology; Bonding; Electrodes; Electronics packaging; Fabrication; Packaging machines; Semiconductor device packaging; Substrates; Surface acoustic wave devices; Through-silicon vias; Wafer scale integration; Face to Face bonding; Packaging; SAW devices; Through substrate via; Wafer level chip size packaing;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location
Rome
ISSN
1948-5719
Print_ISBN
978-1-4244-4389-5
Electronic_ISBN
1948-5719
Type
conf
DOI
10.1109/ULTSYM.2009.5441877
Filename
5441877
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