• DocumentCode
    2002035
  • Title

    Modelling of cycle to cycle behaviour for partial discharge events within a spherical cavity in a solid dielectric material by using Finite Element Analysis

  • Author

    Illias, Hazlee A. ; Chen, George ; Lewin, Paul L.

  • Author_Institution
    Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK
  • fYear
    2010
  • fDate
    4-9 July 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A partial discharge (PD) analysis method that can be used to observe cycle to cycle behaviour of PD activity is to plot PD charge magnitude and voltage of PD occurrence against phase angle for certain numbers of cycles of the applied voltage. The advantage of this method is it gives a better picture of PD activity behaviour in terms of the sequence of discharge events. In this paper, the cycle to cycle behaviour of experimental measurements of PD in a spherical cavity within a solid dielectric material has been obtained and compared with simulation results from a PD model. The paper includes the description of the development of the model using the Finite Element Analysis (FEA) method. The model can effectively reproduce the PD cycle to cycle behaviour of the experiment. Through analyzing the cycle to cycle behaviour of PD events, understanding of the physical mechanisms involved in PD activity can be obtained, such as the effects of initial electron generation rate, charge decay and temperature change between consecutive discharges.
  • Keywords
    dielectric materials; finite element analysis; partial discharges; FEA method; PD activity behaviour; PD charge magnitude; charge decay; cycle-to-cycle behaviour; electron generation rate; finite element analysis; partial discharge event; solid dielectric material; spherical cavity; Cavity resonators; Dielectric materials; Discharges; Electrodes; Electron traps; Partial discharges; Surface discharges; dielectric material; finite element analysis method; partial discharge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
  • Conference_Location
    Potsdam
  • Print_ISBN
    978-1-4244-7945-0
  • Electronic_ISBN
    978-1-4244-7943-6
  • Type

    conf

  • DOI
    10.1109/ICSD.2010.5567996
  • Filename
    5567996