• DocumentCode
    2002967
  • Title

    Evaluation of synthetic silica glasses by the ultrasonic microspectroscopy technology

  • Author

    Arakawa, Mototaka ; Shimamura, Hideki ; Kushibiki, Jun-ichi

  • Author_Institution
    Dept. Electr. Eng., Tohoku Univ., Sendai, Japan
  • fYear
    2009
  • fDate
    20-23 Sept. 2009
  • Firstpage
    1559
  • Lastpage
    1562
  • Abstract
    Ultrasonic microspectroscopy technology was applied to characterization of synthetic silica glasses. Acoustic properties (longitudinal and shear velocities, leaky surface acoustic wave velocity, and density), fictive temperature Tf, chlorine concentration C(Cl), and OH concentration C(OH) were measured, and related relationships among their properties were discussed. The longitudinal velocities in the acoustic properties have the highest sensitivities of 5.93°C/(m/s), -202 wtppm/(m/s), and -31 wtppm/(m/s), with resolutions of 0.6°C, 20 wtppm, and 3.1 wtppm, to Tf, C(Cl), and C(OH), respectively. The variations in the acoustic velocities due to Tf, C(Cl), and C(OH) are mainly caused by variations in elastic constants, except for shear velocity due to C(OH).
  • Keywords
    acoustic wave velocity; elastic constants; glass; nondestructive testing; surface acoustic waves; ultrasonic applications; SiO2; acoustic properties; chlorine concentration; elastic constants; leaky surface acoustic wave velocity; longitudinal velocities; shear velocities; silica glasses; ultrasonic microspectroscopy; Acoustic measurements; Glass; Optical refraction; Optical sensors; Optical surface waves; Optical variables control; Silicon compounds; Surface acoustic waves; Ultrasonic variables measurement; Velocity measurement; fictive temperature; impurity; synthetic silica glass; ultrasonic microspectroscopy; velocity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2009 IEEE International
  • Conference_Location
    Rome
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4244-4389-5
  • Electronic_ISBN
    1948-5719
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2009.5441923
  • Filename
    5441923