• DocumentCode
    2003933
  • Title

    A 252Cf time-of-flight system for SEU testing

  • Author

    Reier, Melvin ; Swift, Gary

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    1993
  • fDate
    13-16 Sep 1993
  • Firstpage
    93
  • Lastpage
    96
  • Abstract
    A time-of-flight (TOF) system using one micron phosphors optically coupled to RCA8850 photomultiplier (PM) tubes has been developed and demonstrated. Excellent separation between light and heavy fission fragments has been obtained. SEU events are correlated with the specific fragment causing the upset
  • Keywords
    californium; integrated circuit testing; ion beam effects; photomultipliers; time of flight mass spectroscopy; Cf; IC radiation effects; LET; SEU testing; fission fragments; heavy ions; light ions; photomultiplier tubes; single event upset; time-of-flight system; Detectors; Electron tubes; Laboratories; Optical coupling; Phosphors; Photomultipliers; Propulsion; Signal to noise ratio; Single event upset; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and its Effects on Components and Systems, 1993.,RADECS 93., Second European Conference on
  • Conference_Location
    St. Malo
  • Print_ISBN
    0-7803-1793-9
  • Type

    conf

  • DOI
    10.1109/RADECS.1993.316548
  • Filename
    316548
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2003933