• DocumentCode
    2003987
  • Title

    Solid state microdosimeter for spacecraft applications

  • Author

    Roth, D.R. ; McNulty, P.J. ; Beauvais, W.J. ; Reed, R.A. ; Thompson, A.V. ; Stassinopoulos, E.G.

  • Author_Institution
    Dept. of Phys. & Astron., Clemson Univ., SC, USA
  • fYear
    1993
  • fDate
    13-16 Sep 1993
  • Firstpage
    84
  • Lastpage
    87
  • Abstract
    An instrument is described which is designed to characterize the complex radiation environments of space, including solar flares, in terms of the risk of SEUs in microelectronics and the risk to the health of astronauts. The data generated during exposure consist of pulse height spectra measured when energetic charged particles traverse p-n junctions having dimensions comparable to the SEU-sensitive junctions of modern microelectronics. Proper choice of junction allows the instrument to test environmental models and/or characterize the risk of SEU for specific technologies. Because the sensitive volume associated with each microjunction also has dimensions comparable to those of biological cells, the data can also be used to characterize the environment according to its risk to astronauts
  • Keywords
    detector circuits; dosimeters; nuclear electronics; radiation monitoring; semiconductor counters; space vehicles; SEU-sensitive junctions; SEUs; astronauts; biological cells; complex radiation environments; energetic charged particles; environmental models; exposure; health; microelectronics; microjunction; p-n junctions; pulse height spectra; solar flares; solid state microdosimeter; space; spacecraft applications; Current measurement; Instruments; Microelectronics; P-n junctions; Pulse generation; Pulse measurements; Single event transient; Solar power generation; Solid state circuits; Space vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and its Effects on Components and Systems, 1993.,RADECS 93., Second European Conference on
  • Conference_Location
    St. Malo
  • Print_ISBN
    0-7803-1793-9
  • Type

    conf

  • DOI
    10.1109/RADECS.1993.316550
  • Filename
    316550