Pulsed mixed n, γ radiation fields for electronic testing

Author

Vie, Michel ; Baboulet, Jean Pierre ; Lapeyre, Pascal ; Ramisse, Daniel ; Nurdin, Guy ; Becret, Claude ; Jaureguy, Jean Claude

Author_Institution

DGA, Centre d´´Etudes de Gramat, France

fYear

1993

fDate

13-16 Sep 1993

Firstpage

33

Lastpage

36

Abstract

For combined n, γ TREE testing we have modified the CALIBAN Fast Burst Reactor Field with CdO/Epoxy converters to cover the range [10¹¹-10¹²] n.cm^-2(1 MeV Si), [10⁷-10⁸] cGy(Si).s^-1. Activation and fission σ Φ¯, 1 MeV(Si) fluences, neutron spectra, total exposures and dose rates were predicted with good agreement by n, γ photon transport codes

Keywords

gamma-ray effects; neutron effects; semiconductor device testing; CALIBAN Fast Burst Reactor Field; activation fluences; combined n, γ TREE testing; dose rates; fission fluences; gamma radiation fields; neutron radiation fields; neutron spectra; photon transport codes; pulsed mixed radiation; total exposures; transient radiation effects on electronics; Benchmark testing; Cadmium compounds; Converters; Detectors; Electronic equipment testing; Inductors; Light scattering; Neutrons; Silicon; US Department of Transportation;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and its Effects on Components and Systems, 1993.,RADECS 93., Second European Conference on

Conference_Location

St. Malo

Print_ISBN

0-7803-1793-9

Type

conf

DOI

10.1109/RADECS.1993.316555

Filename

316555