Enhanced field emission properties from carbon nanotube emitters grown on NiCr alloy surfaces with grain boundary effect

Author

Yim, Setha ; Ohta, Riichiro ; Killian, Jessie L. ; Zuckerman, Nathaniel B. ; Allen, Emily ; Nguyen, Cattien V.

Author_Institution

NASA Ames Res. Center, ELORET Corp., Moffett Field, CA

fYear

2008

fDate

22-24 April 2008

Firstpage

433

Lastpage

434

Abstract

In this paper, we demonstrate enhanced field emission properties from MWNT emitters grown directly on the 80/20 NiCr alloy surface due to the grain boundary effect. The elemental segregation was clearly demonstrated by AES elemental mapping, where Cr and O surface segregation inhibited MWNT growth. The potential for this simple process is that it may be employed for fabricating CNT emitters without requiring any metal deposition step nor microlithography 3. process in order to minimize the field screening effect.

Keywords

carbon nanotubes; chromium alloys; field emission; grain boundaries; nickel alloys; CNT emitters; NiCr; alloy surface; alloy surfaces; carbon nanotube emitters; elemental segregation; field emission properties; field screening effect; grain boundary effect; grain boundary effects; microlithography; Carbon nanotubes; Chemical engineering; Chemistry; Chromium alloys; Current density; Grain boundaries; Inorganic materials; NASA; Organic materials; Substrates; 80/20 and 70/30 NiCr metal alloys; auger elemental mapping; carbon nanotube; field emission; grain boundary effect; segregation;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electronics Conference, 2008. IVEC 2008. IEEE International

Conference_Location

Monterey, CA

Print_ISBN

978-1-4244-1715-5

Type

conf

DOI

10.1109/IVELEC.2008.4556389

Filename

4556389