DocumentCode
2005307
Title
Gas poisoning of 612-M and 311-XM cathodes
Author
Kwan, Joe ; Bieniosek, Frank ; Henestroza, Enrique ; Leitner, Matthaeus ; Mitchell, Russell ; Miram, George ; Prichard, B. ; Scarpetti, Ray ; Waldron, Will ; Westenskow, Glen
Author_Institution
Lawrence Berkeley Nat. Lab., Berkeley, CA
fYear
2008
fDate
22-24 April 2008
Firstpage
44
Lastpage
45
Abstract
A 2 kA cathode was successfully developed for the DARHT-II injector [1]. Since the DARHT injector cannot be baked and there may be virtual leaks, the local pressure near the cathode was not ideal even though the system pressure was in the 10-8 Torr range. In a series of experiments using quarter-inch size button cathodes, we showed that gas poisoning was a significant factor in this pressure range. Furthermore we found that the 311-XM (doped with scandium and has an M coating) cathode was less affected by gas poisoning than the 612-M, corresponding to a lower effective work function. Water vapor was found to be the worst contaminant among the various gases that we have tested. With a 6.5rdquo diameter 311-XM cathode, the DARHT-II injector produced > 2 kA corresponding to a current density of 10 A/cm2.
Keywords
cathodes; current density; 311-XM cathode; 612M cathode; DARHT injector; current density; gas poisoning; water vapor; Cathodes; Coatings; Current density; Degradation; Electrons; Gases; Optical sensors; Temperature measurement; Testing; Voltage; DARHT injector; M type dispenser cathode; gas poisoning; scandium;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference, 2008. IVEC 2008. IEEE International
Conference_Location
Monterey, CA
Print_ISBN
978-1-4244-1715-5
Type
conf
DOI
10.1109/IVELEC.2008.4556407
Filename
4556407
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