• DocumentCode
    2005307
  • Title

    Gas poisoning of 612-M and 311-XM cathodes

  • Author

    Kwan, Joe ; Bieniosek, Frank ; Henestroza, Enrique ; Leitner, Matthaeus ; Mitchell, Russell ; Miram, George ; Prichard, B. ; Scarpetti, Ray ; Waldron, Will ; Westenskow, Glen

  • Author_Institution
    Lawrence Berkeley Nat. Lab., Berkeley, CA
  • fYear
    2008
  • fDate
    22-24 April 2008
  • Firstpage
    44
  • Lastpage
    45
  • Abstract
    A 2 kA cathode was successfully developed for the DARHT-II injector [1]. Since the DARHT injector cannot be baked and there may be virtual leaks, the local pressure near the cathode was not ideal even though the system pressure was in the 10-8 Torr range. In a series of experiments using quarter-inch size button cathodes, we showed that gas poisoning was a significant factor in this pressure range. Furthermore we found that the 311-XM (doped with scandium and has an M coating) cathode was less affected by gas poisoning than the 612-M, corresponding to a lower effective work function. Water vapor was found to be the worst contaminant among the various gases that we have tested. With a 6.5rdquo diameter 311-XM cathode, the DARHT-II injector produced > 2 kA corresponding to a current density of 10 A/cm2.
  • Keywords
    cathodes; current density; 311-XM cathode; 612M cathode; DARHT injector; current density; gas poisoning; water vapor; Cathodes; Coatings; Current density; Degradation; Electrons; Gases; Optical sensors; Temperature measurement; Testing; Voltage; DARHT injector; M type dispenser cathode; gas poisoning; scandium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2008. IVEC 2008. IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-1715-5
  • Type

    conf

  • DOI
    10.1109/IVELEC.2008.4556407
  • Filename
    4556407