Research on failure analysis method of the key components in SMPS

Electronic equipments propose the higher requirements for the performance and reliability of SMPS because of its continuous development. In the core components of SMPS, MOSFET and aluminum electrolytic capacitor are the key components that affect its reliability, and they have a higher failure and degradation rates among all of the components. Therefore, it is important to have a failure analysis for MOSFET and aluminum electrolytic capacitor. This paper mainly describes the failure analysis of MOSFET and aluminum electrolytic capacitor by the means of stress analysis method and parameter analysis method. The mean of stress analysis method is to monitor the main stresses that cause the components degradation failure, while the parameter analysis method is to monitor the change of the components main parameters that can reflect the components degradation state. However, both methods have their application limitations.