DocumentCode
2007380
Title
On mechanisms to increase electric strength of n-hexane in micron gaps
Author
Klimkin, V.F.
Author_Institution
Dept. of Phys., Novosibirsk State Univ., Russia
fYear
1993
fDate
19-23 Jul 1993
Firstpage
405
Lastpage
409
Abstract
The author presents results of optical and statistical studies of prebreakdown phenomena and electrical breakdown of n-hexane in a quasiuniform field of ~0.9-3.5 MV/cm (the duration of voltage exposure ranges from 20 ns to 2 μs) within gaps 25-150 μm in length. Boundaries for the realization of the mechanism of breakdown from cathode and anode depending on the field strength and distance between electrodes were defined. It is established that increase in breakdown field with reduction in gap length takes place in the case of the bubble breakdown mechanism from the cathode
Keywords
organic compounds; 20 ns to 2 mus; 25 to 150 micron; anode; bubble breakdown mechanism; cathode; electric strength; electrical breakdown; field strength; gap length; micron gaps; n-hexane; optical studies; prebreakdown phenomena; quasiuniform field; statistical studies; Anodes; Cathodes; Electric breakdown; Electrodes; Ionization;
fLanguage
English
Publisher
ieee
Conference_Titel
Conduction and Breakdown in Dielectric Liquids,1993., ICDL '93., IEEE 11th International Conference on
Conference_Location
Baden-Dattwil
Print_ISBN
0-7803-0791-7
Type
conf
DOI
10.1109/ICDL.1993.593976
Filename
593976
Link To Document