Relays fail - test systems don´t have to

As the trend in automated test continues toward hardware standardization, engineers increasingly rely on large switch architectures to customize the connectivity in their applications. When designed correctly, these switch systems route signals almost transparently between instruments and test points, improving measurement repeatability and reducing test time. Unfortunately, while these switches maximize flexibility, the number of potential failure points increases with each new relay in the system. Switching considerations are often overlooked during development, and the resulting automated test equipment (ATE) performance is frequently diminished. To successfully integrate switching, engineers need to design systems to avoid, anticipate, and resolve system failures. This paper examines some techniques to effectively manage the risks associated with large switching systems.