• DocumentCode
    2007616
  • Title

    Effect of substitution on the transport properties of the half-Heusler alloy ZrNiSn

  • Author

    Ponnambalam, V. ; Pope, A.L. ; Xia, Y. ; Bhattacharya, S. ; Poon, S.J. ; Tritt, T.M.

  • Author_Institution
    Dept. of Phys., Virginia Univ., Charlottesville, VA, USA
  • fYear
    1999
  • fDate
    Aug. 29 1999-Sept. 2 1999
  • Firstpage
    340
  • Lastpage
    343
  • Abstract
    Substituted semiconductor alloys exhibit effects due to doping and disorder. To focus on the effect of disorder on transport properties, we have investigated isoelectronic Zr/sub 1-x/Hf/sub x/NiSn (x=0.0-0.3) and heavily substituted Zr/sub 0.5/Hf/sub 0.5/Ni/sub 0.7/Pd/sub 0.3/Sn/sub 0.95/, half Heusler alloys. Upon substitution, Zr/sub 1-x/Hf/sub x/NiSn alloys exhibit resistivity ratios R=/spl rho//sub 4.2K///spl rho//sub 295K/ as large as /spl sim/300 and thermally activated conduction in the temperature range 100-295K. At 4.2K, the (Zr,Hf)NiSn alloys possess carrier densities of /spl sim/10/sup 16/ to 10/sup 18/ cm/sup -3/ and carrier mobilities in the range /spl sim/100-350 cm/sup 2//V-s. The opposite signs exhibited by the Hall coefficient and thermopower, along with the saturation of resistivity at low temperature in ZrNiSn and Zr/sub 0.5/Hf/sub 0.5/Ni/sub 0.7/Pd/sub 0.3/Sn/sub 0.95/ alloys indicate band overlapping. Various scenarios of bandgap structures are discussed.
  • Keywords
    Hall effect; carrier density; carrier mobility; energy gap; hafnium alloys; nickel alloys; semiconductor materials; thermoelectric power; tin alloys; zirconium alloys; 10 to 295 K; 4.2 K; Hall coefficient; Zr/sub 0.5/Hf/sub 0.5/Ni/sub 0.7/Pd/sub 0.3/Sn/sub 0.95/; band overlapping; bandgap structures; carrier density; carrier mobility; disorder; half-Heusler alloy; resistivity; substituted semiconductor alloys; substitution; thermally activated conduction; thermopower; Charge carrier density; Hafnium; Nickel alloys; Semiconductor device doping; Semiconductor materials; Temperature distribution; Thermal conductivity; Thermal resistance; Tin; Zirconium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 1999. Eighteenth International Conference on
  • Conference_Location
    Baltimore, MD, USA
  • ISSN
    1094-2734
  • Print_ISBN
    0-7803-5451-6
  • Type

    conf

  • DOI
    10.1109/ICT.1999.843399
  • Filename
    843399