DocumentCode
2007616
Title
Effect of substitution on the transport properties of the half-Heusler alloy ZrNiSn
Author
Ponnambalam, V. ; Pope, A.L. ; Xia, Y. ; Bhattacharya, S. ; Poon, S.J. ; Tritt, T.M.
Author_Institution
Dept. of Phys., Virginia Univ., Charlottesville, VA, USA
fYear
1999
fDate
Aug. 29 1999-Sept. 2 1999
Firstpage
340
Lastpage
343
Abstract
Substituted semiconductor alloys exhibit effects due to doping and disorder. To focus on the effect of disorder on transport properties, we have investigated isoelectronic Zr/sub 1-x/Hf/sub x/NiSn (x=0.0-0.3) and heavily substituted Zr/sub 0.5/Hf/sub 0.5/Ni/sub 0.7/Pd/sub 0.3/Sn/sub 0.95/, half Heusler alloys. Upon substitution, Zr/sub 1-x/Hf/sub x/NiSn alloys exhibit resistivity ratios R=/spl rho//sub 4.2K///spl rho//sub 295K/ as large as /spl sim/300 and thermally activated conduction in the temperature range 100-295K. At 4.2K, the (Zr,Hf)NiSn alloys possess carrier densities of /spl sim/10/sup 16/ to 10/sup 18/ cm/sup -3/ and carrier mobilities in the range /spl sim/100-350 cm/sup 2//V-s. The opposite signs exhibited by the Hall coefficient and thermopower, along with the saturation of resistivity at low temperature in ZrNiSn and Zr/sub 0.5/Hf/sub 0.5/Ni/sub 0.7/Pd/sub 0.3/Sn/sub 0.95/ alloys indicate band overlapping. Various scenarios of bandgap structures are discussed.
Keywords
Hall effect; carrier density; carrier mobility; energy gap; hafnium alloys; nickel alloys; semiconductor materials; thermoelectric power; tin alloys; zirconium alloys; 10 to 295 K; 4.2 K; Hall coefficient; Zr/sub 0.5/Hf/sub 0.5/Ni/sub 0.7/Pd/sub 0.3/Sn/sub 0.95/; band overlapping; bandgap structures; carrier density; carrier mobility; disorder; half-Heusler alloy; resistivity; substituted semiconductor alloys; substitution; thermally activated conduction; thermopower; Charge carrier density; Hafnium; Nickel alloys; Semiconductor device doping; Semiconductor materials; Temperature distribution; Thermal conductivity; Thermal resistance; Tin; Zirconium;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermoelectrics, 1999. Eighteenth International Conference on
Conference_Location
Baltimore, MD, USA
ISSN
1094-2734
Print_ISBN
0-7803-5451-6
Type
conf
DOI
10.1109/ICT.1999.843399
Filename
843399
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