The impact of test instrumentation with distributed processing capabilities on test program set (TPS) architecture and development

Author

McGoldrick, Michael

Author_Institution

Assembly Test Div., Teradyne, Inc., North Reading, MA, USA

fYear

2011

fDate

12-15 Sept. 2011

Firstpage

321

Lastpage

327

Abstract

Modern digital interconnection methods have placed significant computational demands on computers controlling test systems, and adding dedicated computing resources for high performance digital test instrumentation to the test system can help meet these demands. This paper examines the impact of these additional computing resources on the design of a TPS, and proposes a software framework to assist developers in creating TPSs for multi-computer environments.

Keywords

digital instrumentation; distributed processing; message passing; multiprocessor interconnection networks; computers controlling test systems; computing resources; digital interconnection methods; distributed processing capabilities; high performance digital test instrumentation; multicomputer environments; software framework; test program set architecture; Computer architecture; Computers; Instruments; Payloads; Servers; Software; Synchronization; IVI; IVI custom specific driver; LVDS; LXI; TPS; clock speeds; digital; instrument driver; inter-process communication; message passing; subTPS; synchronization;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON, 2011 IEEE

Conference_Location

Baltimore, MD

ISSN

1088-7725

Print_ISBN

978-1-4244-9362-3

Type

conf

DOI

10.1109/AUTEST.2011.6058742

Filename

6058742