DocumentCode
2008429
Title
Triaxial force measurement cantilever by sidewall-doping with rapid thermal diffusion
Author
Aoyama, Yuichiro ; Binh-Khiem, Nguyen ; Noda, Kentaro ; Takei, Yusuke ; Kan, Tetsuo ; Iwase, Eiji ; Matsumoto, Kiyoshi ; Shimoyama, Isao
Author_Institution
Univ. of Tokyo, Tokyo, Japan
fYear
2010
fDate
24-28 Jan. 2010
Firstpage
619
Lastpage
622
Abstract
We propose a triaxial force measurement cantilever with piezoresistors fabricated by rapid thermal diffusion sidewall-doping. The device is developed as a tool for applying quantitative mechanical stimuli to cells and measuring their mechanical properties at the same time. The device consists of a sensing tip, two sensing beams, and four wiring beams. We form piezoresistors on the surface of the sensing tip and the sidewalls of the two sensing beams. We confirmed that our device was able to measure triaxial forces. The displacement sensitivities of the device were 1.59Ã10-3 ¿m-1, 1.18Ã10-3 ¿m-1 and 3.26Ã10-4 ¿m-1 for x, y, and z-direction, respectively.
Keywords
biological techniques; cantilevers; force measurement; gold; microsensors; piezoresistive devices; rapid thermal processing; resistors; semiconductor doping; silicon; thermal diffusion; Au; Si; cell mechanical property; displacement sensitivity; mechanical stimuli; piezoresistor; rapid thermal diffusion sidewall doping; triaxial force measurement cantilever; Electrical resistance measurement; Force measurement; Force sensors; Mechanical factors; Mechanical variables measurement; Piezoresistive devices; Probes; Stress measurement; Thermal force; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems (MEMS), 2010 IEEE 23rd International Conference on
Conference_Location
Wanchai, Hong Kong
ISSN
1084-6999
Print_ISBN
978-1-4244-5761-8
Electronic_ISBN
1084-6999
Type
conf
DOI
10.1109/MEMSYS.2010.5442332
Filename
5442332
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