• DocumentCode
    2009452
  • Title

    Scalability of network-on-chip communication architecture for 3-D meshes

  • Author

    Weldezion, Awet Yemane ; Grange, Matt ; Pamunuwa, Dinesh ; Lu, Zhonghai ; Jantsch, Axel ; Weerasekera, Roshan ; Tenhunen, Hannu

  • Author_Institution
    Dept. of Electron., Comput., & Software Syst., KTH R. Inst. of Technol., Kista
  • fYear
    2009
  • fDate
    10-13 May 2009
  • Firstpage
    114
  • Lastpage
    123
  • Abstract
    Design constraints imposed by global interconnect delays as well as limitations in integration of disparate technologies make 3D chip stacks an enticing technology solution for massively integrated electronic systems. The scarcity of vertical interconnects however imposes special constraints on the design of the communication architecture. This article examines the performance and scalability of different communication topologies for 3D network-on-chips (NoC) using through-silicon-vias (TSV) for inter-die connectivity. Cycle accurate RTL-level simulations are conducted for two communication schemes based on a 7-port switch and a centrally arbitrated vertical bus using different traffic patterns. The scalability of the 3D NoC is examined under both communication architectures and compared to 2D NoC structures in terms of throughput and latency in order to quantify the variation of network performance with the number of nodes and derive key design guidelines.
  • Keywords
    integrated circuit design; integrated circuit interconnections; network-on-chip; 3D chip stacks; 3D meshes; 7-port switch; global interconnect delays; inter-die connectivity; network-on-chip communication architecture; through-silicon-vias; Circuit topology; Communication switching; Delay; Network topology; Network-on-a-chip; Scalability; Switches; Telecommunication traffic; Through-silicon vias; Traffic control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Networks-on-Chip, 2009. NoCS 2009. 3rd ACM/IEEE International Symposium on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4244-4142-6
  • Electronic_ISBN
    978-1-4244-4143-3
  • Type

    conf

  • DOI
    10.1109/NOCS.2009.5071459
  • Filename
    5071459