• DocumentCode
    2011968
  • Title

    Thermoelectric Properties of Epitaxial Films of Layered Cobalt Oxides Fabricated by Topotactic Ion-Exchange Methods

  • Author

    Sugiura, Kenji ; Ohta, Hiromichi ; Nomura, Kenji ; Saito, Tomohiro ; Ikuhara, Yuichi ; Hirano, Masahiro ; Hosono, Hideo ; Koumoto, Kunihito

  • Author_Institution
    Graduate Sch. of Eng., Nagoya Univ.
  • fYear
    2006
  • fDate
    6-10 Aug. 2006
  • Firstpage
    99
  • Lastpage
    102
  • Abstract
    Epitaxial film of a layered cobalt oxide, Ca3Co4 O9, was fabricated on a (0001)-face of alpha-Al2 O3 substrate by a topotactic ion exchange method using a Na0.8CoO2 epitaxial film as a precursor. High-resolution X-ray diffraction and atomic force microscope measurements revealed that the film was high-quality (001)-oriented Ca 3Co4O9 with stepped & terraced surface morphology. The film exhibits a high electrical conductivity of 2.95 times 102 Scm-1 and a large Seebeck coefficient of ~+125 muVK-1, which leads to the thermoelectric power factor of 4.5 times 10-4 Wm-1 K-1 at 300 K
  • Keywords
    Seebeck effect; X-ray diffraction; atomic force microscopy; calcium compounds; electrical conductivity; ion exchange; semiconductor epitaxial layers; semiconductor materials; surface chemistry; surface morphology; thermoelectric power; 2.95E2 S/cm; 300 K; AFM; Al2O3; Ca3Co4O9; Na0.8CoO2 epitaxial film precursor; Seebeck coefficient; X-ray diffraction; alpha-alumina substrate; atomic force microscopy; cobalt oxide thermoelectric properties; electrical conductivity; film orientation; film surface morphology; high resolution XRD; layered cobalt oxide epitaxial films; thermoelectric power factor; topotactic ion exchange methods; Atomic force microscopy; Atomic layer deposition; Atomic measurements; Cobalt; Conductive films; Force measurement; Substrates; Surface morphology; Thermoelectricity; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 2006. ICT '06. 25th International Conference on
  • Conference_Location
    Vienna
  • ISSN
    1094-2734
  • Print_ISBN
    1-4244-0811-3
  • Electronic_ISBN
    1094-2734
  • Type

    conf

  • DOI
    10.1109/ICT.2006.331290
  • Filename
    4133246