DocumentCode
2012080
Title
BA-BIST: Board test from inside the IC out
Author
Conroy, Zoe ; Crouch, Andrew
Author_Institution
Cisco Syst. Inc., San Jose, CA, USA
fYear
2013
fDate
6-13 Sept. 2013
Firstpage
1
Lastpage
1
Abstract
With shrinking geometries of PCBs, increasing interface speeds and corresponding loss of test point access to diagnose structural test defects, new standard test mechanisms are needed to test chip-to-chip connectivity and functionality at the board level. New requirements for an integrated circuit `BA´ (Board-Assist) BIST to structurally test these interfaces will be presented. A standardized BA-BIST template and algorithms for industry leverage are proposed.
Keywords
built-in self test; integrated circuit testing; printed circuit testing; BA-BIST algorithms; BA-BIST standardization template; IC interfaces; board level functionality; board-assist build-in self test; chip-to-chip connectivity test; interface speeds; Barium; Built-in self-test; Industries; Integrated circuits; Manufacturing; Random access memory; Standardization;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference (ITC), 2013 IEEE International
Conference_Location
Anaheim, CA
ISSN
1089-3539
Type
conf
DOI
10.1109/TEST.2013.6651919
Filename
6651919
Link To Document