• DocumentCode
    2013769
  • Title

    PRASE: An Approach for Program Reliability Analysis with Soft Errors

  • Author

    Xu, Jianjun ; Shen, Rui ; Tan, Qingping

  • Author_Institution
    Sch. of Comput., Nat. Univ. of Defense Technol., Changsha, China
  • fYear
    2008
  • fDate
    15-17 Dec. 2008
  • Firstpage
    240
  • Lastpage
    247
  • Abstract
    Soft errors are emerging as a new challenge in computer applications. Current studies about soft errors mainly focus on the circuit and architecture level. Few works discuss the impact of soft errors on programs. This paper presents a novel approach named PRASE, which can analyze the reliability of a program with the effect of soft errors. Based on the simple probability theory and the corresponding assembly code of a program, we propose two models for analyzing the probabilities about error generation and error propagation. The analytical performance is increased significantly with the help of basic block analysis. The program¿s reliability is determined according to its actual execution paths. We propose a factor named PVF (program vulnerability factor), which represents the characteristic of program¿s vulnerability in the presence of soft errors. The experimental results show that the reliability of a program has a connection with its structure. Comparing with the traditional fault injection techniques, PRASE has the advantage of faster speed and lower price with more general results.
  • Keywords
    probability; software fault tolerance; PRASE; error generation; error propagation; fault injection techniques; probability theory; program reliability analysis; program vulnerability factor; soft errors; Assembly; Circuit faults; Computer applications; Computer architecture; Computer errors; Electromagnetic interference; Error analysis; Error correction; Hardware; Performance analysis; Fault Injection; Program Reliability; Soft Error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Computing, 2008. PRDC '08. 14th IEEE Pacific Rim International Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-0-7695-3448-0
  • Electronic_ISBN
    978-0-7695-3448-0
  • Type

    conf

  • DOI
    10.1109/PRDC.2008.30
  • Filename
    4725302