• DocumentCode
    2014133
  • Title

    Space compaction of test responses for IP cores using orthogonal transmission functions

  • Author

    Seuring, Markus ; Chakrabarty, Krishnendu

  • Author_Institution
    Inst. for Comput. Sci., Univ. of Potsdam, Germany
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    213
  • Lastpage
    219
  • Abstract
    Space compaction of test responses provides parallel access to functional outputs and reduces delays on functional paths between cores. We present a new space compaction approach for IP cores that only uses information about the fault-free responses for a precomputed test set T. It does not make any assumption about an underlying fault model, and it does not make use of any structural information about the core. Advantages of this approach include zero aliasing for all errors and optimum (provable maximum) compaction ratio. The compactor design is based on the use of orthogonal transmission functions, which allow all errors produced by T to be propagated through the space compactor. We illustrate the proposed method by presenting case studies on compactor synthesis for several ISCAS benchmark circuits
  • Keywords
    application specific integrated circuits; automatic testing; delays; industrial property; integrated circuit testing; logic testing; IP cores; ISCAS benchmark circuits; compaction ratio; fault-free responses; functional outputs; functional paths; orthogonal transmission functions; parallel access; precomputed test set; space compaction; test responses; zero aliasing; Circuit faults; Circuit synthesis; Circuit testing; Compaction; Computer science; Delay effects; Intellectual property; Logic testing; Propagation delay; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2000. Proceedings. 18th IEEE
  • Conference_Location
    Montreal, Que.
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-0613-5
  • Type

    conf

  • DOI
    10.1109/VTEST.2000.843848
  • Filename
    843848