DocumentCode
2014182
Title
A Functional Unit with Small Variety of Highly Reliable Cells
Author
Suzuki, Kazunori ; Nakada, Takashi ; Nakanishi, Masaki ; Yamashita, Shigeru ; Nakashima, Yasuhiko
Author_Institution
Grad. Sch. of Inf., Nara Inst. of Sci. & Technol., Ikoma, Japan
fYear
2008
fDate
15-17 Dec. 2008
Firstpage
353
Lastpage
354
Abstract
Recently, the miniaturization process has brought an increase in transistor variations and in the failure rate at transistors. We propose a small variety of new standard cells. The proposed cells can correct and detect transistor faults. A functional unit with the proposed cells shows better fault tolerance. The area of this unit is approximately 1.4 times that of traditional cells.
Keywords
fault diagnosis; semiconductor device reliability; transistors; miniaturization process; transistor failure rate; transistor faults; transistor variations; Circuit faults; Copper; Delay effects; Electrical fault detection; Fault detection; Fault tolerance; Informatics; Logic; MOS devices; Threshold voltage; fault detection; fault tolerance; transistor variation;
fLanguage
English
Publisher
ieee
Conference_Titel
Dependable Computing, 2008. PRDC '08. 14th IEEE Pacific Rim International Symposium on
Conference_Location
Taipei
Print_ISBN
978-0-7695-3448-0
Electronic_ISBN
978-0-7695-3448-0
Type
conf
DOI
10.1109/PRDC.2008.39
Filename
4725318
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