DocumentCode
2014703
Title
Crosstalk effect removal for analog measurement in analog test bus
Author
Su, Chauchin ; Chen, Yue-Tsang
Author_Institution
Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
fYear
2000
fDate
2000
Firstpage
403
Lastpage
408
Abstract
A DSP based test methodology is proposed to remove the parasitic and crosstalk effects, the two major drawbacks when using the analog buses. Experiments, using SPICE simulation and real measurement data show a significant improvement over the direct measurement
Keywords
automatic testing; crosstalk; design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; DSP based test methodology; SPICE simulation; analog measurement; analog test bus; crosstalk effect removal; measurement data; mixed-signal circuits; parasitic effects; Circuit testing; Crosstalk; Digital signal processing; Integrated circuit interconnections; Integrated circuit measurements; Integrated circuit packaging; Integrated circuit testing; SPICE; Semiconductor device measurement; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location
Montreal, Que.
ISSN
1093-0167
Print_ISBN
0-7695-0613-5
Type
conf
DOI
10.1109/VTEST.2000.843871
Filename
843871
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