• DocumentCode
    2015055
  • Title

    Abruptness of axial Si-Ge heterojunctions in nanowires

  • Author

    Nastovjak, Alla G. ; Neizvestny, Igor G. ; Shwartz, Nataliya L.

  • Author_Institution
    Inst. of Semicond. Phys., SB RAS, Novosibirsk, Russia
  • fYear
    2010
  • fDate
    June 30 2010-July 4 2010
  • Firstpage
    55
  • Lastpage
    58
  • Abstract
    The process of Si-Ge heterostructures formation in nanowhiskers (NWs) grown by the vapor-liquid-solid mechanism was investigated using Monte Carlo simulation. It was demonstrated that it is impossible to grow atomically abrupt axial heterojunctions via classical vapor-liquid-solid mechanism due to gradual change of catalyst drop composition when switching the fluxes. Dependences of GexSi1-x composition in transition region on the ratio of germanium and silicon fluxes and deposition duration were investigated. The width of Si-Ge axial heterojunction was found to be dependent on NW diameter d. In adsorption-induced growth mode the width has linear dependence on d and in diffusion-induced growth mode it is either constant (when growth rate ~1/d) or proportional to 1/d (when growth rate ~1/d2).
  • Keywords
    Monte Carlo methods; adsorption; elemental semiconductors; germanium; nanofabrication; nanowires; semiconductor growth; semiconductor heterojunctions; semiconductor quantum wires; silicon; whiskers (crystal); Monte Carlo simulation; Si-Ge; abruptness; adsorption-induced growth mode; atomically abrupt axial heterojunctions; axial heterojunction width; catalyst drop composition; deposition duration dependence; flux switching; germanium-silicon flux ratio dependence; growth rate; nanowhisker diameter; nanowires; transition region composition; vapor-liquid-solid growth mechanism; Computational modeling; Cryptography; Lead; Microelectronics; Nanowires; Quantum computing; Silicon; Monte Carlo; Nanowhisker; heterojunction; simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro/Nanotechnologies and Electron Devices (EDM), 2010 International Conference and Seminar on
  • Conference_Location
    Novosibirsk
  • Print_ISBN
    978-1-4244-6626-9
  • Type

    conf

  • DOI
    10.1109/EDM.2010.5568666
  • Filename
    5568666