DocumentCode
2015137
Title
Statistical dependence of pixel intensities for pattern recognition
Author
Smielik, Ievgen ; Kuhnert, Klaus-Dieter
Author_Institution
Inst. for Real-Time Learning Syst., Univ. of Siegen, Siegen, Germany
fYear
2013
fDate
25-28 Feb. 2013
Firstpage
1179
Lastpage
1183
Abstract
In this paper, we describe an algorithm for speeding up object recognition by reducing the amount of pixels taken into account when processing images. We show that some statistically stable regions can be found on an image. Taking just one pixel from each region preserves the most of information of the image. We employ linear dependency between pixel intensity values to organize neighbouring pixels in groups. Bayesian classification was chosen to prove suitability. We present the results that show computation speed increase without significant performance losses.
Keywords
Bayes methods; image classification; object recognition; statistical analysis; Bayesian classification; image information preservation; image processing; linear dependency; object recognition; pattern recognition; pixel intensity values; statistical dependence; Bayes methods; Computational modeling; Correlation; Encryption; Face; Probability density function; Probability distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Technology (ICIT), 2013 IEEE International Conference on
Conference_Location
Cape Town
Print_ISBN
978-1-4673-4567-5
Electronic_ISBN
978-1-4673-4568-2
Type
conf
DOI
10.1109/ICIT.2013.6505840
Filename
6505840
Link To Document