• DocumentCode
    2015137
  • Title

    Statistical dependence of pixel intensities for pattern recognition

  • Author

    Smielik, Ievgen ; Kuhnert, Klaus-Dieter

  • Author_Institution
    Inst. for Real-Time Learning Syst., Univ. of Siegen, Siegen, Germany
  • fYear
    2013
  • fDate
    25-28 Feb. 2013
  • Firstpage
    1179
  • Lastpage
    1183
  • Abstract
    In this paper, we describe an algorithm for speeding up object recognition by reducing the amount of pixels taken into account when processing images. We show that some statistically stable regions can be found on an image. Taking just one pixel from each region preserves the most of information of the image. We employ linear dependency between pixel intensity values to organize neighbouring pixels in groups. Bayesian classification was chosen to prove suitability. We present the results that show computation speed increase without significant performance losses.
  • Keywords
    Bayes methods; image classification; object recognition; statistical analysis; Bayesian classification; image information preservation; image processing; linear dependency; object recognition; pattern recognition; pixel intensity values; statistical dependence; Bayes methods; Computational modeling; Correlation; Encryption; Face; Probability density function; Probability distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Technology (ICIT), 2013 IEEE International Conference on
  • Conference_Location
    Cape Town
  • Print_ISBN
    978-1-4673-4567-5
  • Electronic_ISBN
    978-1-4673-4568-2
  • Type

    conf

  • DOI
    10.1109/ICIT.2013.6505840
  • Filename
    6505840