• DocumentCode
    2017692
  • Title

    Advance semiconductor package applied on high efficiency dual-mode DC-DC buck converter

  • Author

    Ho, Cheng-Yu ; Cheng, Hung-Hsiang ; Chung, Ming-Feng ; Wang, Chen-Chao ; Yang, Cing-Wen ; Wang, Hung-Yu

  • Author_Institution
    Electrical Laboratory, Corporation Design Division, Corporate R&D, Advanced Semiconductor Engineering (ASE) Inc, Kaohsiung, Taiwan
  • fYear
    2015
  • fDate
    11-14 Aug. 2015
  • Firstpage
    183
  • Lastpage
    186
  • Abstract
    This work analyzes the electrical performance for three different packaging types applied on power management IC (PMIC) using a high efficiency dual-mode DC-DC buck converter. A 600 mA with 93 % efficiency dual-mode DC-DC buck converter is designed and fabricated by TSMC 0.35-µm CMOS process. The chip area is smaller about 2.1 mm2. The packaging parasitic effects of advanced single sided substrates (aS3 package) with wire-bond interconnect / copper pillar bump and fan-out wafer level chip scale package (fan-out WLP) are extracted from the layout drawings using the Ansys Q3D Extractor. A SPICE based circuit model of DC-DC buck converter is applied to determine the power dissipation. The power dissipation of the DC-DC buck converter implemented on aS3 package with wire-bond interconnect / copper pillar bump and fan-out WLP are 20 mW, 6 mW, and 5 mW, respectively. For high efficiency DC-DC buck converter application, aS3 package with copper pillar bump is applicable for medium pin count solutions and low cost packaging technology. Fan-out WLP is applicable for high pin count solutions with small-size and high performance.
  • Keywords
    CMOS integrated circuits; Capacitors; Copper; Inductors; Switches; Advance single sided substrate (aS3 package); Copper pillar bump; High efficiency DC-DC buck converter; Packaging parasitics; Power dissipation; fan-out wafer level chip scale package (Fan-out WLP);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
  • Conference_Location
    Changsha, China
  • Type

    conf

  • DOI
    10.1109/ICEPT.2015.7236571
  • Filename
    7236571