DocumentCode
2018073
Title
Application Of Heterodyne Interferometry To Scanning Coherent Optical Microscopy
Author
Cho, Kyuman ; Mazzoni, David L. ; Davis, Christopher C.
Author_Institution
University of Maryland
fYear
1992
fDate
16-19 Nov 1992
Firstpage
327
Lastpage
328
Keywords
Focusing; Frequency; Image resolution; Optical interferometry; Optical microscopy; Optical mixing; Probes; Rough surfaces; Scanning electron microscopy; Surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
LEOS '92, Conference Proceedings. IEEE Lasers and Electro-Optics Society, 1992 Annual Meeting
Print_ISBN
0-7803-0526-4
Type
conf
DOI
10.1109/LEOS.1992.693974
Filename
693974
Link To Document