• DocumentCode
    2018080
  • Title

    1.9 ∼ 2.6GHz tuning range variable gain low-noise amplifier with digital assisted automatic tuning loop

  • Author

    Xiao Wang ; Chuansheng Dong ; Shengguo Cao ; Na Yan ; Xi Tan ; Hao Min

  • Author_Institution
    State Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
  • fYear
    2011
  • fDate
    5-7 June 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A novel wide tuning range variable gain differential low-noise amplifier (LNA) with digital assisted automatic tuning loop for multi-mode receiver is proposed in this paper. Common gate LNA with cross-coupled capacitor (CCC) and positive feedback is applied for tuning flexibility and high gain, low noise performance. Digital assisted automatic tuning mechanism reuses the output load inductor and capacitor tank to configure an auxiliary oscillator while tuning, and re-configures it back to narrowband LNA, without extra chip area and power consumption. A testchip is fabricated in 0.13μm CMOS. Measurement results show an LNA performance of 8~26dB variable voltage gain, 2dB NF, -5.5dBm IIP3 and S11<;-10dB. The digital assisted automatic frequency tuning range covers 1.9-2.6GHz with 1% tuning error. The circuit consumes 8mA with 1.2V power supply and the core layout size is 0.35mm×0.55mm.
  • Keywords
    CMOS analogue integrated circuits; UHF amplifiers; UHF oscillators; capacitors; inductors; low noise amplifiers; CCC; CMOS process; LNA; auxiliary oscillator; cross-coupled capacitor tank; current 8 mA; digital assisted automatic tuning loop; frequency 1.9 GHz to 2.6 GHz; gain 2 dB; gain 8 dB to 26 dB; multimode receiver; output load inductor; positive feedback; power consumption; size 0.13 mum; tuning range variable gain low-noise amplifier; voltage 1.2 V; Gain; Logic gates; Noise; Noise measurement; Oscillators; Resonant frequency; Tuning; Automatic tuning; digital assisted; low-noise amplifier;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium (RFIC), 2011 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4244-8293-1
  • Electronic_ISBN
    1529-2517
  • Type

    conf

  • DOI
    10.1109/RFIC.2011.5940666
  • Filename
    5940666