DocumentCode
2020859
Title
Clarification of Cu rich phase in SAC/FeNi solder joint
Author
Gao, Li-Yin ; Liu, Zhi-Quan
Author_Institution
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, 110016, China
fYear
2015
fDate
11-14 Aug. 2015
Firstpage
715
Lastpage
718
Abstract
In this study, interfacial reaction of SAC/FeNi solder joints is investigated, and the Cu-rich IMC was clarified according to scanning electron microscopy (SEM) and transmission electron microscopy (TEM) observations. At SAC/27Fe73Ni interface, Cu rich IMC is rod-like dispersing in the solder. On the other hand, at the interface of SAC/55Fe45Ni solder joints, Cu rich IMC has an island-shape. From the EDS analysis, the Cu rich IMC is possibly Cu6 Sn5 with Fe and Ni solid solutionized. However, the morphology of this Cu rich IMC differs from Cu6 Sn5 formed in the same condition of SAC/Cu solder joint greatly. In order to identify this Cu rich IMC precisely, electron diffraction analysis was carried out using TEM on the cross section sample of solder joints. Through sample tilting, a series of selected area electron diffraction (SEAD) patterns of the Cu rich IMC were obtained, which can be indexed with η-Cu6 Sn5 structure exactly. Therefore, the Cu-rich IMC formed at the interface of SAC/FeNi solder joints was clarified as η-(Cu,Ni)6 Sn5 with hexagonal crystal structure.
Keywords
Industries; Iron; Lattices; Lead; Microscopy; Nickel; Tin; Cu rich phase; FeNi alloy; interfacial reaction; phase identification;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
Conference_Location
Changsha, China
Type
conf
DOI
10.1109/ICEPT.2015.7236684
Filename
7236684
Link To Document