• DocumentCode
    2021504
  • Title

    Extraction of SPICE Model for Double Gate Vertical MOSFET

  • Author

    Suseno, Jatmiko E. ; Ahmad, M.T. ; Riyadi, Munawar A. ; Ismail, Razali

  • Author_Institution
    Electr. Eng. Fac., Univ. Teknol. Malaysia, Skudai
  • fYear
    2009
  • fDate
    25-29 May 2009
  • Firstpage
    761
  • Lastpage
    766
  • Abstract
    Vertical MOSFETs device have one important disadvantage, which is higher overlap capacitances such as the separated gate-source and gate-drain parasitic capacitances (CGSO and CGDO), which is known to be most crucial to the high-frequency/speed performance but very hard to extract. In this paper presents parameter extraction techniques to create an extended BSIM model card of vertical p-MOSFETs for circuit simulation with SPICE can be accurately obtained for these overlap capacitances determination.This device was modeled as a subcircuit with any sub elements such as resistors, capacitors and diodes that capture the parasitic effects. The subcircuit was simplified in order to modeling in BSIM easily. The overlap capacitances of vertical p-MOSFET can be determined by using capacitance parameter extraction of quasi static small signal equivalent circuit. The result showed that gate-drain paracitic capacitance (CGDO) is larger than gate-source parasitic capacitance (CGSO).
  • Keywords
    MOSFET; SPICE; capacitors; diodes; resistors; SPICE model; capacitors; circuit simulation; diodes; double gate vertical MOSFET; gate-drain parasitic capacitances; gate-source parasitic capacitances; parameter extraction techniques; resistors; vertical p-MOSFET; Cutoff frequency; Lithography; MOSFET circuits; Parameter extraction; Parasitic capacitance; Physics; SPICE; Silicon; Thermal resistance; Threshold voltage; BSIM model; SPICE; Vertical MOSFET; parasitic capacitances; subcircuit;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Modelling & Simulation, 2009. AMS '09. Third Asia International Conference on
  • Conference_Location
    Bali
  • Print_ISBN
    978-1-4244-4154-9
  • Electronic_ISBN
    978-0-7695-3648-4
  • Type

    conf

  • DOI
    10.1109/AMS.2009.129
  • Filename
    5072084