PTAT sensor for chip overheat protection

Author

Szermer, Michal ; Janicki, Marcin ; Pietrzak, P. ; Kulesza, Z. ; Napieralski, A.

Author_Institution

Dept. of Microelectron. & Comput. Sci., Tech. Univ. of Lodz, Lodz, Poland

fYear

2010

fDate

21-25 Feb. 2010

Firstpage

176

Lastpage

179

Abstract

This paper presents a novel application of a Proportional-To-Absolute-Temperature (PTAT) sensor. The main function of this sensor is to monitor circuit temperature and generate an overheat signal in order to warn about excessive temperature of a circuit. Special emphasis is laid on the description of the design of current mirrors, which are responsible for the output signal voltage drop when circuit temperature exceeds certain preset value. The entire design was validated by measurements of the test ASIC implementing the sensor. The measurements confirmed correct operation of the sensor, but at the same time they revealed high sensitivity of the design to the parameter spread among particular ASICs and to the interference from digital circuitry.

Keywords

application specific integrated circuits; current mirrors; integrated circuit technology; interference (signal); network synthesis; temperature measurement; temperature sensors; PTAT sensor; chip overheat protection; circuit temperature; current mirror design; digital circuitry interference; parameter spread; proportional-absolute-temperature sensor; test ASIC; Application specific integrated circuits; Circuit testing; Mirrors; Particle measurements; Protection; Signal design; Signal generators; Temperature measurement; Temperature sensors; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE

Conference_Location

Santa Clara, CA

ISSN

1065-2221

Print_ISBN

978-1-4244-9458-3

Electronic_ISBN

1065-2221

Type

conf

DOI

10.1109/STHERM.2010.5444294

Filename

5444294