DocumentCode
2024294
Title
Low loss finite width ground plane, thin film microstrip lines on Si wafers
Author
Ponchak, G.E. ; Margomenos, A. ; Katehi, P.B.
Author_Institution
NASA Glenn Res. Center, Cleveland, OH, USA
fYear
2000
fDate
28-28 April 2000
Firstpage
43
Lastpage
47
Abstract
Si RFICs on standard, 2 /spl Omega/-cm Si wafers require novel transmission lines to reduce the loss caused by the resistive substrate. One such transmission line is commonly called thin film microstrip (TFMS), which is created by depositing a metallic ground plane, thin insulating layers, and the microstrip lines on the Si wafer. Thus, the electric fields are isolated from the Si wafer. In this paper, it is shown through experimental results that the ground plane of TFMS may be finite width and comparable to the strip width in size while still achieving low loss on 2 /spl Omega/-cm Si. Measured effective permittivity shows that the field interaction with the Si wafer is small.
Keywords
MMIC; UHF integrated circuits; elemental semiconductors; losses; microstrip lines; permittivity; semiconductor thin films; silicon; 2 ohmcm; RFICs; Si; TFMS; effective permittivity; field interaction; finite width ground plane; loss; metallic ground plane; resistive substrate; thin film microstrip lines; Insulation; Microstrip; Propagation losses; Radiofrequency integrated circuits; Semiconductor thin films; Sputtering; Strips; Substrates; Transistors; Transmission lines;
fLanguage
English
Publisher
ieee
Conference_Titel
Silicon Monolithic Integrated Circuits in RF Systems, 2000. Digest of Papers. 2000 Topical Meeting on
Conference_Location
Garmisch, Germany
Print_ISBN
0-7803-6255-1
Type
conf
DOI
10.1109/SMIC.2000.844294
Filename
844294
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