• DocumentCode
    2024294
  • Title

    Low loss finite width ground plane, thin film microstrip lines on Si wafers

  • Author

    Ponchak, G.E. ; Margomenos, A. ; Katehi, P.B.

  • Author_Institution
    NASA Glenn Res. Center, Cleveland, OH, USA
  • fYear
    2000
  • fDate
    28-28 April 2000
  • Firstpage
    43
  • Lastpage
    47
  • Abstract
    Si RFICs on standard, 2 /spl Omega/-cm Si wafers require novel transmission lines to reduce the loss caused by the resistive substrate. One such transmission line is commonly called thin film microstrip (TFMS), which is created by depositing a metallic ground plane, thin insulating layers, and the microstrip lines on the Si wafer. Thus, the electric fields are isolated from the Si wafer. In this paper, it is shown through experimental results that the ground plane of TFMS may be finite width and comparable to the strip width in size while still achieving low loss on 2 /spl Omega/-cm Si. Measured effective permittivity shows that the field interaction with the Si wafer is small.
  • Keywords
    MMIC; UHF integrated circuits; elemental semiconductors; losses; microstrip lines; permittivity; semiconductor thin films; silicon; 2 ohmcm; RFICs; Si; TFMS; effective permittivity; field interaction; finite width ground plane; loss; metallic ground plane; resistive substrate; thin film microstrip lines; Insulation; Microstrip; Propagation losses; Radiofrequency integrated circuits; Semiconductor thin films; Sputtering; Strips; Substrates; Transistors; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon Monolithic Integrated Circuits in RF Systems, 2000. Digest of Papers. 2000 Topical Meeting on
  • Conference_Location
    Garmisch, Germany
  • Print_ISBN
    0-7803-6255-1
  • Type

    conf

  • DOI
    10.1109/SMIC.2000.844294
  • Filename
    844294