• DocumentCode
    2025347
  • Title

    Packaging and thin-film truncation effects on thin-film open end microstrip line for miniature multilayer MMICs

  • Author

    Rong, Ao Sheng ; Tripathi, Vijai K. ; Sun, Zhong Liang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
  • fYear
    1994
  • fDate
    2-4 Nov 1994
  • Firstpage
    113
  • Lastpage
    115
  • Abstract
    This paper analyzes the packaging and thin-film truncation effects of the open end of thin-film microstrip lines for miniature multilayer MMICs. The formulation is implemented by the 3D finite difference method in conjunction with the higher order asymptotic boundary condition. Special treatment of mesh nodes at the corner and the fringes of the boundary is given by the interpolation. The results presented here show that (1) the field distribution is highly disturbed by the truncation of the thin dielectric film; (2) the electrical performance varies as the thin dielectric film is truncated near the open end; and (3) when a shield metal box, if any, is less than twice the thickness of the substrate, the packaging effect becomes significant
  • Keywords
    integrated circuit packaging; 3D finite difference method; IC packaging; electrical performance; field distribution; higher order asymptotic boundary condition; interpolation; mesh nodes; miniature multilayer MMICs; shield metal box; thin dielectric film; thin-film open end microstrip line; thin-film truncation effects; Boundary conditions; Dielectric films; Dielectric substrates; Field effect MMICs; Finite difference methods; Interpolation; Microstrip; Nonhomogeneous media; Packaging; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic packaging, 1994., IEEE 3rd Topical Meeting on
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-7803-2411-0
  • Type

    conf

  • DOI
    10.1109/EPEP.1994.594105
  • Filename
    594105