• DocumentCode
    2025361
  • Title

    Reconstruction of a profile function using the knowledge of the nonsymmetric intensity of X-rays diffraction in thin films

  • Author

    Permyakov, A.V.

  • Author_Institution
    Dept. of Comput. Phys., St.-Petersburg State Univ., St. Petersburg, Russia
  • fYear
    2008
  • fDate
    3-6 June 2008
  • Firstpage
    153
  • Lastpage
    156
  • Abstract
    The method of reconstruction of a profile function in thin films by X-ray diffraction experiments is extended to asymmetric diffraction pattern.
  • Keywords
    X-ray diffraction; thin films; X-rays diffraction; asymmetric diffraction pattern; nonsymmetric intensity; thin films; Electronic mail; Epitaxial growth; Fourier transforms; Gaussian processes; Image reconstruction; MONOS devices; Nanostructures; Physics computing; Transistors; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Days on Diffraction, 2008. DD '08. Proceedings of the International Conference
  • Conference_Location
    St. Petersburg
  • Print_ISBN
    978-5-9651-0277-8
  • Type

    conf

  • Filename
    5072331
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2025361