Extensions to the contour integral method for efficient modeling of TM scattering in two-dimensional photonic crystals

Author

Preibisch, Jan Birger ; Duan, Xiaohua ; Schuster, Christian

Author_Institution

Inst. for Electromagn. Theor., Tech. Univ. Hamburg-Harburg, Hamburg, Germany

fYear

2013

fDate

16-21 Sept. 2013

Firstpage

493

Lastpage

495

Abstract

We present an extension to the contour integral method (CIM) for the treatment of two-dimensional scattering problems from circular inclusions with plane wave excitation. CIM is an integral equation approach to planar problems whose efficiency can be greatly enhanced by semi-analytical treatment of circular scatterers. It is related to the boundary element method (BEM) and shows promising domain decomposition capabilities. The performance and accuracy is compared to the full-wave finite integral technique (FIT) by studying the scattering of an array of dielectric rods.

Keywords

dielectric materials; integral equations; light scattering; photonic crystals; TM scattering modeling; boundary element method; circular scatterers; contour integral method; dielectric rod array; domain decomposition capabilities; full-wave finite integral technique; plane wave excitation; two-dimensional photonic crystals; two-dimensional scattering problems; Computer integrated manufacturing; Dielectrics; Electromagnetics; Impedance; Microwave circuits; Optical waveguides;

fLanguage

English

Publisher

ieee

Conference_Titel

Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS), 2013 7th International Congress on

Conference_Location

Talence

Print_ISBN

978-1-4799-1229-2

Type

conf

DOI

10.1109/MetaMaterials.2013.6809097

Filename

6809097