A novel load-pull setup with envelope calibration for bias modulated measurements

Author

Bengtsson, Olof ; Vestling, Lars ; Olsson, Jörgen

Author_Institution

Ferdinand-Braun-Inst. fur Hochstfrequenztechnik, Berlin, Germany

fYear

2009

fDate

Sept. 29 2009-Oct. 1 2009

Firstpage

942

Lastpage

945

Abstract

In this paper a measurement system for evaluation of RF-power transistors in high-efficiency operation using drain bias-modulation is presented. The system is based on a novel 2-tone load-pull measurements configuration with envelope synchronized dynamic bias modulation. For the bias modulation a dynamic power analyzer for DC-low frequency power source and monitoring is used. A predicted 10-15 % efficiency enhancement in the backed of region for the studied LDMOS has been verified with the narrow bandwidth system. System calibration includes a general peak-power envelope synchronization method that is possible to use also in wider bandwidth systems.

Keywords

calibration; power transistors; 2-tone load-pull measurements; DC-low frequency power source; LDMOS; RF-power transistors; bias modulated measurements; drain bias-modulation; dynamic power analyzer; envelope calibration; envelope synchronized dynamic bias modulation; load-pull setup; peak-power envelope synchronization method; Bandwidth; Broadband amplifiers; Calibration; Frequency synchronization; High power amplifiers; Monitoring; Oscilloscopes; Power generation; Signal generators; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference, 2009. EuMC 2009. European

Conference_Location

Rome

Print_ISBN

978-1-4244-4748-0

Type

conf

Filename

5296504