A numerically robust method for determination of dielectric material parameters

A novel technique for determination of the complex dielectric constant ε will be presented in this work. Previous techniques for determination of electromagnetic material properties ε and μ from measured S parameters in frequency domain lack of inaccuracy in the vicinity of λm/2 resonances and phase ambiguities. It will be shown how these shortcomings can be avoided assuming that the material can be characterized by its complex permittivity only. Broadband waveguide measurements of samples homogeneously filling the waveguides cross section have been performed to verify the new method for numerically robust determination of material properties. The relative permittivity and loss tangent of a PVC material sample covering X, Kμ, K and K_α band will be presented.