DocumentCode
2028310
Title
Modeling of Target Shadows for SAR Image Classification
Author
Papson, Scott ; Narayanan, Ram
Author_Institution
Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA
fYear
2006
fDate
11-13 Oct. 2006
Firstpage
3
Lastpage
3
Abstract
A recent thrust of non-cooperative target recognition (NCTR) using synthetic aperture radar (SAR) has been to complement the extraction of scattering centers by incorporating information contained in the target shadow. When classifying targets based on the shadow region alone, it is essential that an image be well clustered into its respective shadow, highlight, and background regions. To obtain the segmentation, the intensity and spatial location of a pixel are modeled as a mixture of Gaussian distributions. Expectation-maximization (EM) is used to obtain the corresponding distributions for the three regions within a given image. Anisotropic smoothing is applied to smooth the input image as well as the posterior probabilities. A representation of the shadow boundary is developed in conjunction with a Hidden Markov Model (HMM) ensemble to obtain target classification. A variety of targets from the MSTAR database are used to test the performance of both the segmentation algorithm and classification structure.
Keywords
expectation-maximisation algorithm; hidden Markov models; image classification; image resolution; image segmentation; radar imaging; radar target recognition; synthetic aperture radar; Gaussian mixture distributions; SAR image classification; anisotropic smoothing; classification structure; expectation-maximization; hidden Markov model; noncooperative target recognition; posterior probabilities; segmentation algorithm; synthetic aperture radar; target shadows modeling; Anisotropic magnetoresistance; Data mining; Gaussian distribution; Hidden Markov models; Image classification; Image segmentation; Radar scattering; Smoothing methods; Synthetic aperture radar; Target recognition;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Imagery and Pattern Recognition Workshop, 2006. AIPR 2006. 35th IEEE
Conference_Location
Washington, DC
ISSN
1550-5219
Print_ISBN
0-7695-2739-6
Electronic_ISBN
1550-5219
Type
conf
DOI
10.1109/AIPR.2006.27
Filename
4133945
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