DocumentCode
2032213
Title
Design space exploration of clock-pumping techniques to reduce through-silicon-via (TSV) manufacturing cost in 3-d integration
Author
Weldezion, Awet Yemane ; Weerasekara, R. ; Tenhunen, Hannu
Author_Institution
Dept. of Electron. Syst., KTH-R. Inst. of Technol., Kista, Sweden
fYear
2012
fDate
5-7 Dec. 2012
Firstpage
19
Lastpage
22
Abstract
In this paper, we explore the cost of clock pumping techniques implemented for scalable 3-D Integrated Systems in the complexity of interconnect, circuit, and architecture level changes. Their effect in terms of area and power for comparable performance is estimated. Our results show that by using 50% of the number of TSVs, we achieve the same performance as standard implementation with insignificant area and power overhead from the overall system cost. The proposed pumping technique can be used as one of the components in 3-D systems design for several applications that require logic-on-logic or memory-on-logic stacking.
Keywords
clocks; integrated circuit design; integrated circuit interconnections; three-dimensional integrated circuits; 3D integration; TSV manufacturing cost reduction; architecture level; clock-pumping techniques; design space exploration; interconnection complexity; logic-on-logic stacking; memory-on-logic stacking; through-silicon-via manufacturing cost reduction; Clocks; Decoding; Integrated circuit interconnections; Integrated circuit modeling; Manufacturing; Standards; Through-silicon vias;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference (EPTC), 2012 IEEE 14th
Conference_Location
Singapore
Print_ISBN
978-1-4673-4553-8
Electronic_ISBN
978-1-4673-4551-4
Type
conf
DOI
10.1109/EPTC.2012.6507043
Filename
6507043
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