• DocumentCode
    2032213
  • Title

    Design space exploration of clock-pumping techniques to reduce through-silicon-via (TSV) manufacturing cost in 3-d integration

  • Author

    Weldezion, Awet Yemane ; Weerasekara, R. ; Tenhunen, Hannu

  • Author_Institution
    Dept. of Electron. Syst., KTH-R. Inst. of Technol., Kista, Sweden
  • fYear
    2012
  • fDate
    5-7 Dec. 2012
  • Firstpage
    19
  • Lastpage
    22
  • Abstract
    In this paper, we explore the cost of clock pumping techniques implemented for scalable 3-D Integrated Systems in the complexity of interconnect, circuit, and architecture level changes. Their effect in terms of area and power for comparable performance is estimated. Our results show that by using 50% of the number of TSVs, we achieve the same performance as standard implementation with insignificant area and power overhead from the overall system cost. The proposed pumping technique can be used as one of the components in 3-D systems design for several applications that require logic-on-logic or memory-on-logic stacking.
  • Keywords
    clocks; integrated circuit design; integrated circuit interconnections; three-dimensional integrated circuits; 3D integration; TSV manufacturing cost reduction; architecture level; clock-pumping techniques; design space exploration; interconnection complexity; logic-on-logic stacking; memory-on-logic stacking; through-silicon-via manufacturing cost reduction; Clocks; Decoding; Integrated circuit interconnections; Integrated circuit modeling; Manufacturing; Standards; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2012 IEEE 14th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4673-4553-8
  • Electronic_ISBN
    978-1-4673-4551-4
  • Type

    conf

  • DOI
    10.1109/EPTC.2012.6507043
  • Filename
    6507043