• DocumentCode
    2032545
  • Title

    Study on creep fatigue behaviour of soft solders die attach for power package applications

  • Author

    Dandong Ge ; Che, F.X. ; Yik Siong Tay ; Swee Lee Gan ; Yazid, Mohand

  • Author_Institution
    Infineon Technol. Asia Pacific Pte Ltd., Singapore, Singapore
  • fYear
    2012
  • fDate
    5-7 Dec. 2012
  • Firstpage
    77
  • Lastpage
    83
  • Abstract
    Soft solder die attach is a widely used process for power and high-reliability automotive devices because soft solder has excellent heat-dissipation properties and outstanding robustness against delamination compared to traditional epoxy die attach. However, the creep-fatigue failure is one typical failure mechanism for solder material under thermal cycling. So it is essential to to understand the solder failure due to soft solder creep fatigue behavior. In this work, tensile creep tests for two soft solders, solder A and B, have been conducted at various temperatures and stress levels using a Dynamic Mechanical Analyzer (DMA). Creep constitutive models were developed and the material constants of the model were determined based on experimental results for both solders. The creep constitutive models were implemented in finite element analysis (FEA) to investigate the creep behavior of solder in the power packages for the evaluation of package reliability. Results show that solder A has better creep resistance than solder B, which indicates that the package with using solder A should have higher creep fatigue reliability than package with using solder B when subjected to thermal cycling. The storage modulus, liquidus temperature/solidus temperature for two types of solders were also measured by DMA and Differential Scanning Calorimetry (DSC), respectively.
  • Keywords
    creep testing; differential scanning calorimetry; failure analysis; fatigue testing; finite element analysis; microassembling; reliability; solders; tensile testing; DMA; DSC; FEA; creep constitutive models; creep fatigue reliability; creep resistance; differential scanning calorimetry; dynamic mechanical analyzer; epoxy die attach; finite element analysis; heat-dissipation properties; high-reliability automotive devices; liquidus temperature-solidus temperature; material constants; package reliability evaluation; power devices; power package applications; soft solder creep fatigue behavior; soft solder die attach; solder material failure mechanism; storage modulus; tensile creep tests; thermal cycling; Creep; Reliability; Strain; Stress; Temperature; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2012 IEEE 14th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4673-4553-8
  • Electronic_ISBN
    978-1-4673-4551-4
  • Type

    conf

  • DOI
    10.1109/EPTC.2012.6507055
  • Filename
    6507055