DocumentCode
2033052
Title
Electrical treeing studies on the Araldite LY/HY 5052 epoxy resin over a wide range of stressing voltage
Author
Ding, H.-Z. ; Varlow, B.R.
Author_Institution
Sch. of Eng., Manchester Univ., UK
fYear
2004
fDate
17-20 Oct. 2004
Firstpage
306
Lastpage
309
Abstract
Electrical treeing breakdown (a long-term electrical deterioration process) has been investigated in Araldite LY/HY 5052 epoxy resin pin-plane specimens subjected to a wide range of 50 Hz alternating current electrical stress. The full process of electrical tree initiation and growth was recorded periodically by using a digital camera. The electrical tree growth structural characteristics were examined by means of the measurement of the fractal dimension. The voltage dependence of electrical tree growth time to breakdown was related to the voltage-dependent changes in the fractal dimension of the tree structures. The experimental results obtained in this study are described in terms of a quantitative physical model of electrical tree growth that has been previously proposed by the authors.
Keywords
cameras; epoxy insulation; fractals; insulation testing; trees (electrical); 50 Hz; Araldite LY/HY 5052 epoxy resin; alternating current electrical stress; digital camera; electrical tree growth structural characteristics; electrical tree growth time to breakdown; electrical treeing breakdown; epoxy resin pin-plane specimens; fractal dimension measurement; long-term electrical deterioration process; quantitative physical model; stressing voltage; tree growth; tree initiation; tree structures; voltage-dependent fractal dimension changes; Dielectrics and electrical insulation; Digital cameras; Electric breakdown; Electrodes; Epoxy resins; Stress; Temperature; Testing; Trees - insulation; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on
Print_ISBN
0-7803-8584-5
Type
conf
DOI
10.1109/CEIDP.2004.1364249
Filename
1364249
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