• DocumentCode
    2034663
  • Title

    Warpage modeling for 3D packages

  • Author

    Amagai, Masazumi ; Suzuki, Yuya

  • Author_Institution
    Modeling Group, TMG Japan, Miho, Japan
  • fYear
    2012
  • fDate
    5-7 Dec. 2012
  • Firstpage
    479
  • Lastpage
    489
  • Abstract
    Package warpage is a primary concern in a package-on-package. To enhance the accuracy of modeling prediction, viscoelastic parameters, the change of material properties after injection mold cure (IMC) and post mold cure (PMC) temperature and it´s time, and cure shrinkage were studied with a dynamic modulus analysis (DMA) and a thermal mechanical analysis (TMA) for a mold compound. A nano-indentation tool was used to characterize a viscoelasticity of underfill material. Material properties obtained from the TMA, DMA and nano-indentation tools were introduced to finite-element-based models. The validation of models was verified with a shadow moiré for package warpage. As model simplification, inverse approach is described for an example of package warpage.
  • Keywords
    curing; finite element analysis; integrated circuit modelling; moulding; packaging; three-dimensional integrated circuits; viscoelasticity; 3D packages; DMA; IMC; PMC; TMA; cure shrinkage; dynamic modulus analysis; finite-element-based models; injection mold cure; material properties; model simplification; modeling prediction; mold compound; nano-indentation tools; package warpage; package-on-package; post mold cure; thermal mechanical analysis; underfill material; viscoelastic parameters; viscoelasticity; warpage modeling; Conferences; Decision support systems; Electronics packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2012 IEEE 14th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4673-4553-8
  • Electronic_ISBN
    978-1-4673-4551-4
  • Type

    conf

  • DOI
    10.1109/EPTC.2012.6507131
  • Filename
    6507131