• DocumentCode
    2034736
  • Title

    Wire bond and molding factors influencing bare Cu wire surface conditions

  • Author

    Chan Wai Kok ; Tham Veng Leong ; Wang Mei Yong

  • Author_Institution
    Infineon Technol. Asia Pacific Pte. Ltd., Singapore, Singapore
  • fYear
    2012
  • fDate
    5-7 Dec. 2012
  • Firstpage
    504
  • Lastpage
    510
  • Abstract
    Bare copper (Cu) wire is one of the promising materials used in assembly packaging to replace gold wire. As copper is harder compared to gold, the formation of the looping during wire bonding is a concern and challenge especially to ball neck surface condition. Thus, the objective of this paper is to identify the key parameters that are having significant impact on the ball neck surface condition at wire bond and molding process. Evaluations are performed and the result do identified key factors that are having impact to the ball neck surface condition.
  • Keywords
    copper; lead bonding; moulding; packaging; Cu; assembly packaging; ball neck surface condition; molding factors; wire bond; wire surface conditions; Conferences; Decision support systems; Electronics packaging; Erbium; Logic gates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2012 IEEE 14th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4673-4553-8
  • Electronic_ISBN
    978-1-4673-4551-4
  • Type

    conf

  • DOI
    10.1109/EPTC.2012.6507134
  • Filename
    6507134