• DocumentCode
    2034780
  • Title

    Electrical characterization of multi-layered printed circuit boards

  • Author

    Guastavino, F. ; Centurioni, L. ; Coletti, G. ; Ratto, A. ; Torello, E.

  • Author_Institution
    Electr. Eng. Dept., Univ. of Genova, Italy
  • fYear
    2004
  • fDate
    17-20 Oct. 2004
  • Firstpage
    588
  • Lastpage
    591
  • Abstract
    Multi-layered printed circuit boards (PCB) are an insulating system that sometimes is affected by failures, due to several possible causes. Three following main "weak areas" within the insulation have been identified: (1) the interface between the layers (it can form a privileged path for a total discharge); (2) the presence of gaseous or metallic inclusions in the dielectric, especially in regions affected by divergent fields; (3) the metal coated drilled holes adopted to connect different layers - even in this case the presence of regions with divergent fields can initiate a discharge path. The matter in point has a validity as a method to approach the problem. Therefore, the outcome of an experimental study aimed at deciding the best type of specimen geometry capable of mimicking the role of the above defects along a possible failure mechanism is presented and discussed. Actually, two groups of test patterns and the relevant tests are reported and commented upon.
  • Keywords
    ageing; discharges (electric); electric strength; inclusions; insulation; printed circuits; PCB electrical characterization; dielectric gaseous inclusions; dielectric metallic inclusions; discharge path; divergent fields; electrical ageing; electrical strength; failure mechanism; insulating system; insulation weak areas; interlayer interface; metal coated drilled holes; multilayered printed circuit boards; total discharge; Artificial intelligence; Breakdown voltage; Circuit testing; Copper; Dielectrics and electrical insulation; Gas insulation; Geometry; Optical microscopy; Printed circuits; Slabs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on
  • Print_ISBN
    0-7803-8584-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2004.1364318
  • Filename
    1364318