Diagnosis of microprocessor based measurement instruments, measuring parameters of passive complex quantities

Diagnosis of multiple parametric faults of a measurement part (MP) of a widely spread class of instruments, measuring parameters of passive complex quantities (PCQ) based on the principle of an indirect measurement of PCQ with direct measurement of frequency parameters of perceptible quantities is being considered. A generalised diagnostic model of MP of the inspected class of measurement instruments (MI) is suggested, and a diagnosis method is developed, allowing in case of single faults to simplify computations and to avoid the use of bulky and unstable reactive resistances, the method can be applied for diagnosis and correction of parametric faults of arbitrary multidimensional systems, described by a fractional linear model with tolerance definition of parameters. The common case is considered where known increments are added to unknown system “inputs”: for a little multiplicity of faults the needed number of system “output” measurements is also little. This accelerates the diagnosis process and reduces the number of reference “inputs” (and so the diagnostic hardware)