• DocumentCode
    2036557
  • Title

    RTL functional verification using excitation and observation coverage

  • Author

    Min, Byeong ; Choi, Gwan

  • Author_Institution
    Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    58
  • Lastpage
    63
  • Abstract
    Code-level coverage is often used to measure RTL-level verification progress. However, a simple code-level coverage inaccurately estimates the verification result by considering only the excitations of functional blocks. A coverage measure that considers additional verification qualities, such as conditions checking or observation, can significantly extend the verification accuracy. However, identifying a design error becomes increasingly difficult as design complexity increases. This paper presents heuristic approaches that increase the chance of detecting obvious-but-easily-missed design errors by allowing a designer/verification-engineer to define additional condition states to be checked. The verification approach is implemented using Verilog Programming Language Interface (PLI) and several benchmark circuits are analyzed The results indicate a high correlation between actual error(design mutant) detection rate and the proposed coverage measure The proposed coverage enhances verification performance with less user interaction, fast coverage calculation, and with less system overhead
  • Keywords
    formal verification; hardware description languages; high level synthesis; logic testing; RTL-level verification progress; Verilog Programming Language Interface; code-level coverage; conditions checking; fiinctional blocks; observation; Circuit analysis; Circuit faults; Computer languages; Electric variables measurement; Error correction; Error correction codes; Face detection; Hardware design languages; Signal design; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Level Design Validation and Test Workshop, 2001. Proceedings. Sixth IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-7695-1411-1
  • Type

    conf

  • DOI
    10.1109/HLDVT.2001.972808
  • Filename
    972808